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Electronic Colloquium on Computational Complexity

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REPORTS > AUTHORS > JOHN PEEBLES:
All reports by Author John Peebles:

TR20-140 | 14th September 2020
Ilias Diakonikolas, Themis Gouleakis, Daniel Kane, John Peebles, Eric Price

Optimal Testing of Discrete Distributions with High Probability

We study the problem of testing discrete distributions with a focus on the high probability regime.
Specifically, given samples from one or more discrete distributions, a property $\mathcal{P}$, and
parameters $0< \epsilon, \delta <1$, we want to distinguish {\em with probability at least $1-\delta$}
whether these distributions satisfy $\mathcal{P}$ ... more >>>


TR17-133 | 7th September 2017
Ilias Diakonikolas, Themis Gouleakis, John Peebles, Eric Price

Sample-Optimal Identity Testing with High Probability

We study the problem of testing identity against a given distribution (a.k.a. goodness-of-fit) with a focus on the high confidence regime. More precisely, given samples from an unknown distribution $p$ over $n$ elements, an explicitly given distribution $q$, and parameters $0< \epsilon, \delta < 1$, we wish to distinguish, {\em ... more >>>


TR16-178 | 11th November 2016
Ilias Diakonikolas, Themis Gouleakis, John Peebles, Eric Price

Collision-based Testers are Optimal for Uniformity and Closeness

Comments: 1

We study the fundamental problems of (i) uniformity testing of a discrete distribution,
and (ii) closeness testing between two discrete distributions with bounded $\ell_2$-norm.
These problems have been extensively studied in distribution testing
and sample-optimal estimators are known for them~\cite{Paninski:08, CDVV14, VV14, DKN:15}.

In this work, we show ... more >>>




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