Weizmann Logo
ECCC
Electronic Colloquium on Computational Complexity

Under the auspices of the Computational Complexity Foundation (CCF)

Login | Register | Classic Style



REPORTS > AUTHORS > ABHRANIL CHATTERJEE:
All reports by Author Abhranil Chatterjee:

TR19-063 | 28th April 2019
Vikraman Arvind, Abhranil Chatterjee, Rajit Datta, Partha Mukhopadhyay

Efficient Black-Box Identity Testing for Free Group Algebra

HrubeŇ° and Wigderson [HW14] initiated the study of
noncommutative arithmetic circuits with division computing a
noncommutative rational function in the free skew field, and
raised the question of rational identity testing. It is now known
that the problem can be solved in deterministic polynomial time in
more >>>


TR18-111 | 4th June 2018
Vikraman Arvind, Abhranil Chatterjee, Rajit Datta, Partha Mukhopadhyay

Beating Brute Force for Polynomial Identity Testing of General Depth-3 Circuits

Comments: 1

Let $C$ be a depth-3 $\Sigma\Pi\Sigma$ arithmetic circuit of size $s$,
computing a polynomial $f \in \mathbb{F}[x_1,\ldots, x_n]$ (where $\mathbb{F}$ = $\mathbb{Q}$ or
$\mathbb{C}$) with fan-in of product gates bounded by $d$. We give a
deterministic time $2^d \text{poly}(n,s)$ polynomial identity testing
algorithm to check whether $f \equiv 0$ or ... more >>>




ISSN 1433-8092 | Imprint