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Electronic Colloquium on Computational Complexity

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REPORTS > KEYWORD > DEPTH 3:
Reports tagged with depth 3:
TR09-032 | 16th April 2009
Neeraj Kayal, Shubhangi Saraf

Blackbox Polynomial Identity Testing for Depth 3 Circuits

We study depth three arithmetic circuits with bounded top fanin. We give the first deterministic polynomial time blackbox identity test for depth three circuits with bounded top fanin over the field of rational numbers, thus resolving a question posed by Klivans and Spielman (STOC 2001).

Our main technical result is ... more >>>




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