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REPORTS > KEYWORD > INCIDENCE CONFIGURATION:
Reports tagged with incidence configuration:
TR10-013 | 31st January 2010
Nitin Saxena, C. Seshadhri

From Sylvester-Gallai Configurations to Rank Bounds: Improved Black-box Identity Test for Depth-3 Circuits

Revisions: 1

We study the problem of identity testing for depth-3 circuits, over the
field of reals, of top fanin k and degree d (called sps(k,d)
identities). We give a new structure theorem for such identities and improve
the known deterministic d^{k^k}-time black-box identity test (Kayal &
Saraf, FOCS 2009) to one ... more >>>




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