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REPORTS > KEYWORD > DEPTH-3 CIRCUIT:
Reports tagged with depth-3 circuit:
TR10-167 | 5th November 2010
Nitin Saxena, C. Seshadhri

Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter

Let C be a depth-3 circuit with n variables, degree d and top fanin k (called sps(k,d,n) circuits) over base field F.
It is a major open problem to design a deterministic polynomial time blackbox algorithm
that tests if C is identically zero.
Klivans & Spielman (STOC 2001) observed ... more >>>




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