Partha Mukhopadhyay

We consider the \emph{black-box} polynomial identity testing problem for a sub-class of

depth-4 circuits. Such circuits compute polynomials of the following type:

$

C(x) = \sum_{i=1}^k \prod_{j=1}^{d_i} Q_{i,j},

$

where $k$ is the fan-in of the top $\Sigma$ gate and $r$ is the maximum degree of the ...
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