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REPORTS > KEYWORD > DEPTH-3 DIAGONAL CIRCUIT:
Reports tagged with depth-3 diagonal circuit:
TR18-036 | 21st February 2018
Michael Forbes, Sumanta Ghosh, Nitin Saxena

Towards blackbox identity testing of log-variate circuits

Derandomization of blackbox identity testing reduces to extremely special circuit models. After a line of work, it is known that focusing on circuits with constant-depth and constantly many variables is enough (Agrawal,Ghosh,Saxena, STOC'18) to get to general hitting-sets and circuit lower bounds. This inspires us to study circuits with few ... more >>>




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